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D 59
Dinnebier, Robert E. ,
Rietveld refinement : : practical pattern analysis using TOPAS / / Robert E. Dinnebier, Andreas Leineweber, John S.O. Evans. - Berlin ; ; Boston : : De Gruyter,, [2019]. - 1 online resource (xvi, 331 pages) : il. - Includes bibliographical references and index. - URL: https://library.dvfu.ru/lib/document/SK_ELIB/4F2156D9-5149-4EDB-AE8B-BF3A747F9B13. - ISBN 3110461382 (electronic book bk). - ISBN 9783110461381 (electronic bk.)
Description based on online resource; title from digital title page (viewed on April 29, 2019).
Параллельные издания: Print version: :
~РУБ DDC 548.83
Рубрики: Rietveld method.
X-rays--Diffraction.
Crystallography.
Crystallography.
Rietveld method.
X-rays--Diffraction.
Доп.точки доступа:
ProQuest (Firm)
D 59
Dinnebier, Robert E. ,
Rietveld refinement : : practical pattern analysis using TOPAS / / Robert E. Dinnebier, Andreas Leineweber, John S.O. Evans. - Berlin ; ; Boston : : De Gruyter,, [2019]. - 1 online resource (xvi, 331 pages) : il. - Includes bibliographical references and index. - URL: https://library.dvfu.ru/lib/document/SK_ELIB/4F2156D9-5149-4EDB-AE8B-BF3A747F9B13. - ISBN 3110461382 (electronic book bk). - ISBN 9783110461381 (electronic bk.)
Description based on online resource; title from digital title page (viewed on April 29, 2019).
Параллельные издания: Print version: :
Рубрики: Rietveld method.
X-rays--Diffraction.
Crystallography.
Crystallography.
Rietveld method.
X-rays--Diffraction.
Доп.точки доступа:
ProQuest (Firm)
2.
Подробнее
M 68
Mikhailov, Igor F.
Analyzing Materials Using Joint X-Ray Fluorescence and Diffraction Spectra / / by Igor F. Mikhailov, Alexey A. Baturin, and Anton I. Mikhailov. - Newcastle-upon-Tyne : : Cambridge Scholars Publisher,, ©2020. - 1 online resource (249 p.). - URL: https://library.dvfu.ru/lib/document/SK_ELIB/C5A87A6E-DC7C-4A3B-BF35-5A60EDE4E3D8. - ISBN 1527543897 (electronic book). - ISBN 9781527543898 (electronic book)
Description based on online resource; title from digital title page (viewed on February 25, 2020).
Параллельные издания: Print version: : Mikhailov, Igor F. Analyzing Materials Using Joint X-Ray Fluorescence and Diffraction Spectra. - Newcastle-upon-Tyne : Cambridge Scholars Publisher,c2019. - ISBN 9781527542464
~РУБ DDC 543.56
Рубрики: Fluorescence spectroscopy.
X-ray spectroscopy.
X-rays--Diffraction.
Materials--Analysis.
Аннотация: This book presents a complex approach to material composition determination based on the analysis of the joint X-ray spectrum, including fluorescence, scattering, and diffraction reflections. It considers fluorescence, scattered, and diffracted radiations within the common problem of analytical spectrum formation. The complex methods for analyzing the material composition by joint spectra of fluorescence, Compton scattering and diffraction proposed here allow for a widening of the area of the application of X-ray methods.The book will be useful for specialists in the field of solid state physi.
Доп.точки доступа:
Baturin, Alexey A.
Mikhailov, Anton I.
M 68
Mikhailov, Igor F.
Analyzing Materials Using Joint X-Ray Fluorescence and Diffraction Spectra / / by Igor F. Mikhailov, Alexey A. Baturin, and Anton I. Mikhailov. - Newcastle-upon-Tyne : : Cambridge Scholars Publisher,, ©2020. - 1 online resource (249 p.). - URL: https://library.dvfu.ru/lib/document/SK_ELIB/C5A87A6E-DC7C-4A3B-BF35-5A60EDE4E3D8. - ISBN 1527543897 (electronic book). - ISBN 9781527543898 (electronic book)
Description based on online resource; title from digital title page (viewed on February 25, 2020).
Параллельные издания: Print version: : Mikhailov, Igor F. Analyzing Materials Using Joint X-Ray Fluorescence and Diffraction Spectra. - Newcastle-upon-Tyne : Cambridge Scholars Publisher,c2019. - ISBN 9781527542464
Рубрики: Fluorescence spectroscopy.
X-ray spectroscopy.
X-rays--Diffraction.
Materials--Analysis.
Аннотация: This book presents a complex approach to material composition determination based on the analysis of the joint X-ray spectrum, including fluorescence, scattering, and diffraction reflections. It considers fluorescence, scattered, and diffracted radiations within the common problem of analytical spectrum formation. The complex methods for analyzing the material composition by joint spectra of fluorescence, Compton scattering and diffraction proposed here allow for a widening of the area of the application of X-ray methods.The book will be useful for specialists in the field of solid state physi.
Доп.точки доступа:
Baturin, Alexey A.
Mikhailov, Anton I.
Page 1, Results: 2