A study of the electronic structure of octavinylsilsesquioxane and dendron with chromium based compounds by X-ray photoelectron spectroscopy and quantum chemical modeling in the DFT approximation

 

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539.194
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    A study of the electronic structure of octavinylsilsesquioxane and dendron with chromium based compounds by X-ray photoelectron spectroscopy and quantum chemical modeling in the DFT approximation [Электронный ресурс] / I. S. Osmushko, V. I. Vovna, V. V. Korochentsev, M. V. Tutov, N. P. Shapkin // Journal of Structural Chemistry. - 2011. - Vol. 52, № 12. - S145-S152 . - ISSN 0022-4766

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539.194

Кл.слова (ненормированные):
SILOXANES -- CHELATE COMPLEXES -- XPS -- DFT -- ELECTRONIC STRUCTURE